发明名称 ADHESION FOR SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To miniaturize a cavity in solder with micro size for good adhesion by a method wherein solder is fused on adhesion scheduled region, and a semiconductor element is subject to press-swing with the application of supersonic vibration via fused solder layer. CONSTITUTION:An element 3 adsorbed to the semiconductor element support surface 2 of a collet 11 with the descent of a supersonic vibration transmitting rod 13 to be contacted on the element 3. Next, press, swing and supersonic vibration are applied to the fused solder 5 on the element adhesion scheduled region of a stem 4. In this method, the solder 5 is subject to pressure and release at very high frequency. Besides, a cavity produced on the adhesion surface by the action of forces from the center to the outer boundary is gradually dispersed to a small size with a part thereof dissipated outward of the element 3. Thus, the cavity left in the solder layer is reduced to an extremely micro size in a small amount for the control of thermal resistance with long life time of the device.
申请公布号 JPS57190325(A) 申请公布日期 1982.11.22
申请号 JP19810074861 申请日期 1981.05.20
申请人 TOKYO SHIBAURA DENKI KK 发明人 NAGATA YOSHITAKA;EMOTO TAKAO
分类号 H01L21/52;H01L21/58;(IPC1-7):01L21/58 主分类号 H01L21/52
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