发明名称 MEASURING DEVICE FOR THERMAL CONDUCTIVITY
摘要 PURPOSE:To thin a thickness of a flat plate and to enable simple and efficient measuring of a thermal conductivity of a large number of flat plates, by constituting a device such that two comb teeth-shaped electrodes are formed holding a minute gap on a surface of an insulating substrate, and a thermistor is vacuum-deposited in a gap between the electrodes. CONSTITUTION:A device is that which measures a surface thermal conductivity using a thermistor printed substrate, and the thermistor printed substrate 20 is constituted such that positive and negative electrodes 201 and 202 are printed on one side surface of a ceramic plate 21, which measures, for example, 30mm. long X 150mm. wide X 0.6mm. thick, so that the electrodes engage each other at given intervals. A thermistor 203 is vacuum-deposited so that the gap between the two electrodes is filled, and a glass coating 206 is formed thereon. The constitution causes finding of thermal conductivity solely by measuring a DC voltage, and eliminates the need to measure temperature, which results in enabling to perform a rapid and simple measurement and to manufacture a flat plate with a thickness of 1mm. or less.
申请公布号 JPS57190256(A) 申请公布日期 1982.11.22
申请号 JP19810076271 申请日期 1981.05.19
申请人 HITACHI SEISAKUSHO KK 发明人 TOMITA SATORU;KUDOU MITSUO;ITOU MASAAKI;YAMASHITA ISAO
分类号 G01N25/18;(IPC1-7):01N25/18 主分类号 G01N25/18
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