发明名称 PROCEDIMENTO DI RIDUZIONE A BASSA TEMPERATURA PER FOTOMASCHERE.
摘要 Glass photomasks having a high resolution stain pattern for use in photofabrication processes are made by migrating stain-producing ions into the surface of a glass substrate, and reducing and agglomerating the stain- producing ions in the presence of pure hydrogen under pressure at relatively low temperatures to produce a high resolution stain pattern. <IMAGE>
申请公布号 IT8224351(D0) 申请公布日期 1982.11.19
申请号 IT19820024351 申请日期 1982.11.19
申请人 发明人
分类号 C03C21/00;C03C23/00;G03F1/08;G03F1/54;G03F1/76;(IPC1-7):G03F/ 主分类号 C03C21/00
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