发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain an insulation separation region of high dimensional accuracy, by forming a vertical recession on a silicon substrate and accumulating an insulator in the recession. CONSTITUTION:A recession 11 is formed on a silicon semiconductor substrate 10. Next, an insulator 12 is accumulated by CVD method. Next, the insulator 12 is etched by anisotropic dry etching. The insulator 12 is left only on the side of recession 11. Next, the same insulator 15 as insulator 12 is accumulated by CVD method. Next, a surface insulator is etched. As a result, the flat-surfaced insulation separation region can be formed without occurrence of bird-beak.
申请公布号 JPS57187951(A) 申请公布日期 1982.11.18
申请号 JP19810073070 申请日期 1981.05.14
申请人 MATSUSHITA DENKI SANGYO KK 发明人 KAWAKITA KENJI;FUJITA TSUTOMU;SAKAI HIROYUKI;TAKEMOTO TOYOKI
分类号 H01L21/76;H01L21/302;H01L21/3065;H01L21/31;H01L21/762 主分类号 H01L21/76
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