发明名称 PHOTOMASK SUBSTRATE
摘要 PURPOSE:To detect a positioning mark easily by providing a photomask substrate, which has a positioning mark, with a mask-matching-mark detection mark. CONSTITUTION:A photomask substrate has grid lines 2 made of opaque materials arrayed in a grating shape on its transparent substrate surface and marks 4 for mask matching made of opaque materials encircled with the grid lines and arranged on the transparent substrate surface. Then, marks 5 and 6 for mask matching mark detection are provided adjacently to or in contact with the X- axial and Y-axial grid lines 2 on the basis of the mask matching mark 4. As a result, the mask matching mark detection mark 4 is detected along the grid line 2 to detect a mask matching mark easily and rapidly along the X or Y axis.
申请公布号 JPS57186753(A) 申请公布日期 1982.11.17
申请号 JP19810070656 申请日期 1981.05.13
申请人 OKI DENKI KOGYO KK 发明人 ISHIGURO KENICHI;FURUYA YOSHIHISA
分类号 H01L21/027;G03F1/00;G03F1/38;G03F9/00 主分类号 H01L21/027
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