DEVICE FOR MEASURING CURRENT CONDUCTING LAYER THICKNESS,申请号SU19813292254-传众专利搜索

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发明名称	DEVICE FOR MEASURING CURRENT CONDUCTING LAYER THICKNESS
摘要
申请公布号	SU974103(A1)	申请公布日期	1982.11.15
申请号	SU19813292254	申请日期	1981.05.20
申请人	INST PRIKLADNOJ FIZ AN BSSR	发明人	RUDNITSKIJ VALERIJ A,SU;MELESHKO ANDREJ L,SU;GAVRIS GENRIKH B,SU;SMIRNOVA TAMARA M,SU
分类号	G01B7/06;(IPC1-7):G01B7/10	主分类号	G01B7/06
代理机构		代理人
主权项
地址

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