| 摘要 |
PROBLEM TO BE SOLVED: To provide an opto-device probe mechanism which provides such high-frequency characteristics as in mounting condition with a single element of the opto-device including an LD element for optical communication. SOLUTION: There are provided a long belt-like film substrate wherein a bent wiring pattern and a protruding electrode are formed as required, and a pedestal substrate in which a height alignment electrode of a height corresponding to an element thickness is formed at a signal wiring pattern and a terminal resistance electrode, and a region in which the element is placed is fitted with a soft metal thin plate such as indium. Here, the element is placed on the pedestal substrate and held by the film substrate to measure a high-frequency characteristics.
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