| 摘要 |
Apparatus for detecting the position of a probe relative to a workpiece, for example probe contact with the workpiece, is disclosed. The apparatus includes a transducer for converting probe contact to an electrical signal and a plurality of light emitting semiconductors for wirelessly transmitting an indication of the occurrence of the signal via infrared radiation. The apparatus is capable of operation with either a mechanical switch type probe transducer or a current measuring transformer type probe transducer. The apparatus is easily adapted to transmit the occurrence of probe contact by either amplitude modulation or frequency modulation of the emitted infrared radiation. |
