发明名称 BUILT-IN TEST CIRCUIT FOR ANTISKID SYSTEM
摘要 <p>BUILT-IN TEST CIRCUIT FOR ANTISKID SYSTEM A circuit incorporated with an antiskid system for testing the operability of the system. A multivibrator may be actuated to energize converter circuitry with a signal indicative of a particular wheel speed. The entire antiskid system is then caused to function as though-the vehicle wheels are actually spinning and the vehicle is moving. The major subcircuits of the antiskid system are connected to logic circuitry which senses their operation and produces an output signal to a lamp which is illuminated when the subcircuits are properly operative. When the multivibrator operation is ceased, changes in operation of the various subcircuits is again sensed by the logic circuitry which, if such subcircuits are operating properly, deenergizes the lamp.</p>
申请公布号 CA1135379(A) 申请公布日期 1982.11.09
申请号 CA19800348700 申请日期 1980.03.28
申请人 GOODYEAR AEROSPACE CORPORATION 发明人 RUOF, EDGAR J.
分类号 B60T8/96;B60T8/88;(IPC1-7):60T8/04 主分类号 B60T8/96
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