发明名称 QUANTITATIVE ANALYSIS METHOD OF SB2O3 IN SAMPLE CONSISTING ESSENTIALLY OF ZNO BY FLUORESCENT X-RAY METHOD
摘要 PURPOSE:To analyze Sb2O3 in a sample consisting essentially of ZnO, particularly in a voltage non-linear resistor, analytically and quickly with high accuracy by polishing the sample with #180 carborundum then washing the same and drying it with hot wind thence analyzing the same quantitatively by a fluorescent X-ray method. CONSTITUTION:After a sample is polished with #180 carborundum, it is washed and is dried with hot wind. The Sb2O3 in this sample is determined by a fluorescent X-ray method. Particularly, necessary Bi2O3, MnO2, Cr2O3, Co2O3, SiO2, etc. other than Sb2O3 are contained in a voltage non-linear resistor, but the determination of Bi2O3 is not disturbed by these within a proper quantity range of their contents and therefore Sb2O3 is determined quickly with high accuracy.
申请公布号 JPS57178138(A) 申请公布日期 1982.11.02
申请号 JP19810063223 申请日期 1981.04.28
申请人 MEIDENSHA KK 发明人 FURUYAMA HIDEO;ITOU KUMIKO;SAKAI KIKU;KOBAYASHI SHIYUNSUKE
分类号 G01N23/223 主分类号 G01N23/223
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