发明名称 |
Slit pattern projecting apparatus having alignment detecting means |
摘要 |
A slit lamp device having a slit pattern projecting optical system for projecting an illumination light in a pattern of a slit to a patient's eye. An alignment detecting device is provided for detecting the alignment between the optical axis of the projecting system and the axis of the patient's eye. The device comprises one or more light receiving elements such as phototransistors which are located at one or both sides of the projecting optical axis and in the slit plane.
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申请公布号 |
US4357079(A) |
申请公布日期 |
1982.11.02 |
申请号 |
US19790087238 |
申请日期 |
1979.10.22 |
申请人 |
TOKYO KOGAKU KIKAI KABUSHIKI KAISHA |
发明人 |
KARASAWA, YUKINORI |
分类号 |
G01M11/00;A61B3/12;A61B3/135;G01J1/02;(IPC1-7):A61B3/14;A61B3/10;G03B29/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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