发明名称 TRANSISTOR MEASURING DEVICE
摘要 PURPOSE:To measure breakdown voltage between the collector and the emitter with high accuracy, by connecting a capacitor for opening the base of a transistor to be measured, like a direct current. CONSTITUTION:A switch SW is connected to a contact (a), a designated collector current is applied to transistors Q1, Q2 having a high current amplification factor by means of Darlington connection from a variable voltage source EC, and the collector-emitter voltage in this case is measured by a voltmeter VC. In this case, by a capacitor C0 connected to the measuring circuit, a noise current IN by an inductive noise N flows through the capacitor C0, the bases of the transistors Q1, Q2 and the AC-like ground terminal are selectively short- circuited, the bases of the transistors Q1, Q2 are opened like DC, and the collector-emitter breakdown voltage measured in a state that the base of the transistor has been opened is not dropped by a noise current but is measured with high accuracy.
申请公布号 JPS57178169(A) 申请公布日期 1982.11.02
申请号 JP19810062470 申请日期 1981.04.27
申请人 HITACHI SEISAKUSHO KK 发明人 KANBAYASHI KAZUO
分类号 G01R31/26;H01L21/331;H01L29/73 主分类号 G01R31/26
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