| 摘要 |
FIELD: physics; X-ray inspection. ^ SUBSTANCE: centralizer is additionally equipped with a television system consisting of lens, CCD matrix, and monitor; laser with unidirectional radiation output is used, the axis of which is parallel to the longitudinal axis of the X-ray emitter; in front of the laser, at its optical axis, microlens is installed, focusing the laser radiation in the image plane of the television system lens, the axis of which coincides with the laser axis; between the microlens and the television system lens, on the optical axis of the laser, at 45° to it, the third semi-transparent reflector is installed; at the axis running through the intersection point of the laser axis and this reflector, normal to it, a CCD matrix is located; the distances from the intersection point of the semi-transparent third reflector and the laser axis to the CCD matrix and, correspondingly, to the microlens focus, are equal to each other; the television system lens is installed so that it can be moved along the laser axis for focusing; in front of the lens, a narrow-band light filter is installed, the bandpass maximum of the filter being equal to the laser wavelength. ^ EFFECT: increase in accuracy of object to X-ray emitter distance measurement. ^ 1 dwg |
