Target for calibrating and testing infrared detection devices.

摘要

Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate (14) which supports a target pattern (12) of dielectric material which is at least partially absorbing to infrared radiation. A heater (16) is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02°C and below can be generated for calibrating and testing IR imaging devices.