发明名称 MANUFACTURING METHOD OF SOI SUBSTRATE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method of an SOI substrate having a large-area single-crystal semiconductor layer, a low-cost, highly-productive manufacturing method of an SOI substrate using a glass substrate as the substrate, and furthermore, a large-scale semiconductor device and a low-price semiconductor device manufactured with such an SOI substrate at a high throughput and with high productivity. <P>SOLUTION: A plurality of single-crystal semiconductor layers are formed at given intervals on a glass substrate serving as a supporting substrate, and thereafter the glass substrate is heat-treated. The glass substrate is shrunk by this heat treatment, and along therewith adjacent ones of the single-crystal semiconductor layers come in contact with each other. Application of an energy beam is carried out with the plurality of single-crystal semiconductor layers in contact with one another to integrate the plurality of single-crystal semiconductor layers, and thus a continuous single-crystal semiconductor layer is formed. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008311621(A) 申请公布日期 2008.12.25
申请号 JP20080102308 申请日期 2008.04.10
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;ARAI YASUYUKI
分类号 H01L21/02;G02F1/1333;H01L21/265;H01L21/268;H01L21/322;H01L21/336;H01L27/12;H01L29/786;H01L51/50;H05B33/02;H05B33/14 主分类号 H01L21/02
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