| 摘要 |
PURPOSE:To make it possible to have an excellent observation of the locus that is large and occurs when a transistor is overloaded by raising luminance only during a specified width of pulse. CONSTITUTION:X-axis output of a storage oscilloscope 2 is added to a peak detection circuit 3, and when electric current over the level (A) is generated, pulse 2-a is produced. The level (A) can be easily adjusted by a variable resistor 4. The pulse 2a is added to a modulation time adjusting circuit 5 and the width of the pulse 2-a is enlarged as shown in pulse 2-b. This pulse is reversed by an output circuit 6 and added to the luminance modulation shaft of the storage oscilloscope 2 and its luminance is raised during the period of the pulse than other periods to observe loci b and e. The pulse width of the pulse 2-a is shorter than that during a large locus is being generated, so that the pulse width is stretched to a suitable value with a variable resistor 7. With this setup both normal locus and abnormal locus can be measured satisfactorily. |
