发明名称 Method and means for heat treating semiconductor material using high intensity CW lamps
摘要 Apparatus for annealing semiconductor wafers includes a support for receiving the wafers and resistive heaters for heating the wafers by thermal conduction through the support or by convection. A high intensity arc lamp scans the heated wafers thereby raising the temperature sufficiently for heat treating. The process is simple, rapid, efficient, and does not create damaging thermal stresses in the wafers. The high temperature and short time treatment enables material properties unobtainable with conventional thermal processes.
申请公布号 US4356384(A) 申请公布日期 1982.10.26
申请号 US19810239425 申请日期 1981.03.02
申请人 GAT, ARNON 发明人 GAT, ARNON
分类号 C30B33/00;H01L21/00;H01L21/268;H01L21/324;(IPC1-7):H05B1/00 主分类号 C30B33/00
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