TEST BOARD, TEST SYSTEM AND TEST METHOD

摘要

A test board mounting semiconductor IC(Integrated Circuit) embedding a processor, a test system thereof and a test method thereof are provided to increase the quality of a product and reduce a test time by performing a vector test and mounting test. A test system(200) includes a test board(210) and an ATE(Automatic Test Equipment)(260). A first test program for the vector test of the analog core built in application processor(220) is stored in ATE. The ATM provides a first control signal and a second control signal to the test board. The test board includes a socket(230), a mounting test circuit and a relay(250). The mounting test circuit includes the first memory(242), the second memory(244) and a buffer.