发明名称 HEAD DEVICE FOR MEASURING PLATING THICKNESS BY X RAYS
摘要 PURPOSE:To eliminate the need for positioning readjustment in parts replacement by previsouly adjusting the positions of an X-ray tube, a collimator, etc., and then making them into an assembly. CONSTITUTION:A measuring head 1 is fixed at a distance D from a plated steel plate 2. Then, X rays from an X-ray tube 3 reach an irradiation position A through a collimator 9 fitted to the window 8 of a metallic case 7, and the window 11 of a supporting plate 10 screwed into the case. Fluorescent X rays radiated from the irradiation position A enters an ion chamber 13 through a collimator 12 united with the supporting plate 10 and the intensity is detected by a detector 4. Then, the X-ray tube 3, collimators 9 and 12, etc., are made into one assembly 14, which is adjusted precisely before being fitted to a base 5. Therefore, the assembly 14 is replaced for parts replacement, thus eliminating the need for the position adjustment of parts.
申请公布号 JPS57172205(A) 申请公布日期 1982.10.23
申请号 JP19810057458 申请日期 1981.04.16
申请人 DAINI SEIKOSHA KK 发明人 NAKANO NOBUO;UTOU YOSHIO
分类号 G01B15/02;G01N23/223;(IPC1-7):01B15/02 主分类号 G01B15/02
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