发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE BY BONDING TOGETHER SILICON SUBSTRATES
摘要 <p>: There is provided a method of fabricating a semiconductor device wherein in a bonding surface of a silicon substrate of n-type conductivity are formed recesses having each a bonding surface of a higher order plane index than that of the bonding surface of the silicon substrate, and the substrates are bonded together with an aluminum solder so as to decrease a forward voltage drop FVD. After forming the recesses but prior to the bonding with the aluminum solder, phosphor is diffused into a region ranging from the bonding surface to a depth of 20 microns, thereby further decreasing the forward voltage drop FVD.</p>
申请公布号 CA1134058(A) 申请公布日期 1982.10.19
申请号 CA19820396119 申请日期 1982.02.11
申请人 HITACHI, LTD. 发明人 ONUKI, JIN;SUWA, MASATERU;SOENO, KO;ONODERA, HISAKICHI
分类号 H01L21/22;(IPC1-7):01L21/22 主分类号 H01L21/22
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