发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the disconnection of metallic wiring while enabling high integration by selectively forming an insulating film for isolating elements onto the surface of a substrate, thickly shaping a semiconductor layer for forming the elements and flattening the surface. CONSTITUTION:The silicon oxide films 22 are shaped selectively onto the surface of the silicon substrate 21, and the silicon single crystal layer 23 is formed onto the whole surface of the silicon substrate 21 in thickness thicker than the thickness of the silicon oxide films 22. The surface of the silicon substrate 21 is ground and flattened mechanically and chemically, and the thickness of silicon single crystal layers 24 grown onto sections 22' where the oxide films 22 of the silicon substrate 21 are not formed is made equal to the thickness of the selective silicon oxide films 22.
申请公布号 JPS57167656(A) 申请公布日期 1982.10.15
申请号 JP19810053407 申请日期 1981.04.08
申请人 MATSUSHITA DENKI SANGYO KK 发明人 AKIYAMA SHIGENOBU;KUGIMIYA KOUICHI
分类号 H01L21/76;H01L21/20;H01L21/302;H01L21/3065;H01L21/31;H01L21/762 主分类号 H01L21/76
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