发明名称 MEASURING METHOD FOR LATCH-UP DIELECTRIC STRENGTH OF COMPLEMENTARY MOS INTEGRATED-CIRCUIT DEVICE
摘要 PURPOSE:To measure the latch-up dielectric strength of an output terminal without setting an output state, by applying the discharged charge of a capacitor to an element to be measured which is normally in operation. CONSTITUTION:When switches 10 and 13 are held as shown in the figure, a capacitor 9 is charged positively by a positive power source 11 for charging. An element 1 to be measured holds itself in operation by being applied with an operating voltage from an operating power source 5 and the switch 10 is changed over to apply the positive charge of the capacitor 9 to the input or output terminal 4 of the element 1. Then, a power-source ammeter 7 inspects whether a power current increass or not. When not, the discharging voltage of the capacitor 9 is raised and said operation is repeated. When an increase in power current is recognized, the capacitor charging voltage is regarded as a latch-up starting voltage. Consequently, it is not necessary to hold an output at a level H or L fixedly, and latch-up dielectric strength is measured easily.
申请公布号 JPS57163876(A) 申请公布日期 1982.10.08
申请号 JP19810049544 申请日期 1981.03.31
申请人 MITSUBISHI DENKI KK 发明人 HATA TSUTOMU;NISHIUCHI TAIJI
分类号 G01R31/26;(IPC1-7):01R31/26 主分类号 G01R31/26
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