摘要 |
PCT No. PCT/JP79/00158 Sec. 371 Date Feb. 25, 1980 Sec. 102(e) Date Feb. 25, 1980 PCT Filed Jun. 20, 1979 PCT Pub. No. WO80/00189 PCT Pub. Date Feb. 7, 1980.This invention relates to an apparatus for calibrating a slit width among calibrating apparatuses in a monochromator. There has been the problem that, although the slit width precision of the monochromator has been an important performance item, the calibration of the slit width has not hitherto been performed. This invention employs a bright-line spectrum or zero-order light for the slit width calibration. A peak is found out from among output signals of a lightdetector (20) by means of a peak decision unit (26). The peak value is stored into a memory (28). This peak value and the output of the lightdetector (20) are compared by a comparator (32). The slit width is calibrated on the basis of the quantity of wavelength scanning till the coincidence of both the values.
|