| 摘要 |
PURPOSE:To achieve micro-diagnostic in a high speed and to cope with an additional instructions easily, by enabling to read/write the content of latch possible for scanning-in with a program itself. CONSTITUTION:When scan-in is made from an external device SVP, an address SA is transferred to a bus SAB through a selector SELA, and a scan-in data SID are transferred to a bus SIDB through a selector SELD. On the other hand, in case of microporgram, an address ADR and data DATA from a register CSDR are respectively selected with the selectors SELA and SELD, and transferred to a scan address bus SAB and a scan-in data bus SIDB. When the address ADR is decoded with a decoder DEC1, signals SE1-SEn are outputted to corresponding latches RT1-RTn and the data DATA is written in them. |
