发明名称 SIZE MEASURING DEVICE
摘要 PURPOSE:To make it possible to measure the size of an object in non-contacting manner and yet with high accuracy by a simple mechanism, by opening optical gate arrays of a prescribed structure at a constant cycle in turn, and then, by counting times when pulse signal of a photocell pauses in the shadow of the object to be measured. CONSTITUTION:Electrodes 11 and 12... are arranged on an electrooptic material substrate 20, and deflecting boards 2A and 2B are arranged on the both sides of the electrodes. And, when voltage is impressed only onto two adjoining electrodes. And, when voltage is impressed only onto two adjoining electrodes by a driving circuit 7 for scanning at a constant cycle in turn, the deflecting surface of the impressed electrode deflects the light to pass through. In this mechanism, when sheet-like flux of light is applied to a wire 1, a shadow 10 is cast on an array element 2, and if optical gates are opened in turn under this condition, signals of a series of pulses are obtained at the place where there is no shadow while pulse signal of a photocell 4 pauses at the place of the shadow 10, and therefore, line and diameter are measured by counting the pausing times. It is possible, by doing so, to measure dimensions in non-contacting manner with high accuracy.
申请公布号 JPS57154002(A) 申请公布日期 1982.09.22
申请号 JP19810039941 申请日期 1981.03.19
申请人 YOKOGAWA DENKI SEISAKUSHO KK 发明人 KURITA YOSHIO
分类号 G01D5/36;G01B11/02;G01B11/10;G01D5/347 主分类号 G01D5/36
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