发明名称 INSPECTING DEVICE FOR ADHESION STATE
摘要 PURPOSE:To detect defective adhered parts accurately by hammering the adhered matter of adherends and detecting the time interval of the output of a piezoelectric element on the hammer generated at this time. CONSTITUTION:The top surface of the adhered part of adherends 1, 2 consisting of metallic plates or the like is tapped with a hammer 6 provided with a piezoelectric element 9 on a hammering head 7. The output of the element 8 is inputted via a preamplifier to a waveform shaping circuit, by which it is converted to a square wave. In a decision circuit, the time interval (t) of the square wave is compared with the threshold value tO corresponding to the time interval of the piezoelectric output in a normal adhered part. If foam or other defective adhered part 4 exists in the part 3, the time is t>tO, and this is decided as a defective adhered part and is displayed in a display device. Thereby, the adhered state is inspected extremely easily and accurately.
申请公布号 JPS57153247(A) 申请公布日期 1982.09.21
申请号 JP19810038261 申请日期 1981.03.17
申请人 KOGYO GIJUTSUIN (JAPAN) 发明人 SAKATA OKITSUGU;USUI YUUICHI
分类号 G01N19/04;(IPC1-7):01N19/04 主分类号 G01N19/04
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