发明名称 SYSTEM FOR CHECKING CIRCUIT ELEMENT
摘要 PURPOSE:To ensure the checking of the electric characteristics and the quality of connection readily, by applying a pulse current whose inclination is increased or decreased to a parallel circuit of a circuit element having self-inductance component and a diode. CONSTITUTION:To both ends of the parallel circuit of the element having the self-inductance component L and the diode D, the pulse current i1 having a specified inclination of rise up and fall is applied from a pulse current generating circuit 1. By an oscilloscope 2, a voltage Vab across both ends of the circuit, which is expressed by Vab=LX(di/dt), is observed. The value is -KL at the time of rise up and KL at the time of fall (where K is a constant). Therefore, the quality of the connection of the circuit parts and the electric characteristics can be readily and positively checked in this system without removing the inductance element and visual observation.
申请公布号 JPS57151871(A) 申请公布日期 1982.09.20
申请号 JP19810036390 申请日期 1981.03.13
申请人 FUJITSU KK 发明人 TATENO HARUNOBU;WADA KAZUHIKO
分类号 G01R31/00;G01R31/02;G01R31/26 主分类号 G01R31/00
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