发明名称 |
DATA TRANSMISSION SYSTEM WITH TEST LOOP FACILITIES |
摘要 |
<p>When testing a data transmission system comprising two transmission devices it is feasible that the test loops of both transmission devices are closed so that a latched (locked-in) state is created, wherein the loop signal continuously circulates from one transmission device to the other thus preventing a return to the normal state of data transmission via the two lines. It is the object of the present invention to test the data transmission system without incurring a latched state. According to the present invention at least one bit of the loop signal - adapted to be transmitted to the first transmission device via the second transmission device - is changed before it is re-transmitted to the second transmission device. Use in data transmission systems adapted to operate in outgoing and incoming direction, in particular in the transmission of envelopes.</p> |
申请公布号 |
CA1131729(A) |
申请公布日期 |
1982.09.14 |
申请号 |
CA19780312348 |
申请日期 |
1978.09.28 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
FINCK, HERBERT;REISINGER, KONRAD |
分类号 |
H04B17/40;H04L1/24;(IPC1-7):04L5/14;04L1/24 |
主分类号 |
H04B17/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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