发明名称 DATA TRANSMISSION SYSTEM WITH TEST LOOP FACILITIES
摘要 <p>When testing a data transmission system comprising two transmission devices it is feasible that the test loops of both transmission devices are closed so that a latched (locked-in) state is created, wherein the loop signal continuously circulates from one transmission device to the other thus preventing a return to the normal state of data transmission via the two lines. It is the object of the present invention to test the data transmission system without incurring a latched state. According to the present invention at least one bit of the loop signal - adapted to be transmitted to the first transmission device via the second transmission device - is changed before it is re-transmitted to the second transmission device. Use in data transmission systems adapted to operate in outgoing and incoming direction, in particular in the transmission of envelopes.</p>
申请公布号 CA1131729(A) 申请公布日期 1982.09.14
申请号 CA19780312348 申请日期 1978.09.28
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 FINCK, HERBERT;REISINGER, KONRAD
分类号 H04B17/40;H04L1/24;(IPC1-7):04L5/14;04L1/24 主分类号 H04B17/40
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