| 摘要 |
In the case of the production of cables from at least one metallic conductor and one insulating plastic sheath, test devices are known which are used for finding a defect in the plastic sheath. In particular, voltage test sets are used in this case, the cable being passed continuously through the test device in the cable line. In the past, defective cable elements were cut out after stopping the cable production machine. The object of the invention is no longer to interrupt the production of the cable in the cable line when a defect occurs, but to mark the cable by machine at the defective point such that the defect can be found again at any time by machine. This is achieved by means of a mechanical marking device for reproduceable damage of the plastic sheath in the region of the defect, the mechanical marking device being operatively connected to the cable as a function of a pulse which is emitted by the test device at the defect location. In consequence, every defect is initially enlarged once and made uniform so that it can easily be found.
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