| 摘要 |
PURPOSE:To judge the quality of a datum plane quickly and correctly by a method wherein a plurality of measuring elements are arranged at a plurality of different positions at which assembly datum planes are measured and the data which show the shape of the datum planes are obtained simulteneously and are computer-processed. CONSTITUTION:An electron gun 2 is held tightly by holding portions 19a and 19b and is positioned. A sliding portion 15 of a table 11 is shifted untill the tips of respective measuring elements 4-6 of a displacement mechanism 7 reach the end portion A of the electron gun 2 by the control signal from a computer-controlling portion 10 to a driving mechanism 9. The tips of the measuring elements 4, 5 and 6 touch assembly datum planes 49, 47 and 53 of the electron gun 2 via an air cylinder by the control signal from the computing portion 10 to a positioning mechanism 8. The sliding portion 15 is shifted at the specified transfer speed by the driving mechanism 9. The output data from electric micrometers 46, 48 and 52 are processed by the counter-controlling portion 10 via amplifiers 54-56, an electronic switch 57 and an ADC58 and the quality of the assembly is indicated 59. With this constitution, the quality of the datum plane is judged quickly and correctly. |
