| 摘要 |
PURPOSE:To reduce the testing time as well as to indicate and records the results of the testing for each terminal simultaneously for the subject semiconductor IC by a method wherein the detected output voltage of each terminal on the IC is compared with the reference voltage, the status of each terminal is indicated, and the reference voltage is controlled by the comparison output. CONSTITUTION:Each voltage of terminals 2-16 is detected by applying the reference voltage E on the terminal 1 of the IC through the intermediary of the earthing resistors for their respective terminal, and the results are compared 40 with the reference voltage 60. The digital information sent from a processor 90a is D/A converted 70 by the reference voltage, and a direct current reference value is set. When a line junction is in a normal state, the corresponding LED's 50a and 50b are lit, the information of comparators 40a and 40b is processed 90a and memorized 90b through an input circuit 80. The processor 90a picks up the results of the test from the memory 90b, and after the above have been compiled, they are indicated and recorded 90c. With this constitution, the decision whether or not the line junction is performed satisfactory for all terminals is given simultaneously on the same conditions, and the result for individual terminal are indicated and recorded for immediate visual observation. |
