发明名称 METHOD AND APPARATUS FOR INSPECTING PATTERN
摘要 PURPOSE:To automate positioning and improve its accuracy by detecting a scribing line or the positioning mark of the whole and successively moving and controlling the inspecting position of a photo-mask on the basis of the size, etc. of each unit pattern while using the position of said line or mark as the reference. CONSTITUTION:Each unit pattern P on the photo-mask 1 is read photoelectrically, and compared with pattern forming data memorized, and acceptables or defectives are inspected and displayed. The pattern with the scribing lines 2A, 2B is positioned in such a manner that a table is driven from an arbitrary initial location 0, the line edges S1-S4 of the pattern P1 are detected, and the central position C is calculated from each moving distance l1-l4, and used as the reference point of positioning. The photo-mask is moved in the X or Y direction only by a predetermined distance including line width after the P1 is inspected, and the P such as the P2 is positioned. The mask with no scribing line is positioned in such a manner that one of marks M put at both left and right ends is detected as a reference point, and the mask is successively shifted and controlled in the X or Y direction at every the size d of a unit pattern region from the reference point. Accordingly, the inspection of the mask with no physical mark can also be automated and can be executed with high accuracy.
申请公布号 JPS57138135(A) 申请公布日期 1982.08.26
申请号 JP19810023026 申请日期 1981.02.20
申请人 HITACHI SEISAKUSHO KK 发明人 NAKAGAWA KIYOSHI
分类号 G01N21/88;G01N21/93;G01N21/956;G03F1/84;H01L21/027;H01L21/30;H01L21/66 主分类号 G01N21/88
代理机构 代理人
主权项
地址