发明名称 |
Device for analysing the surface of a sample |
摘要 |
A device for determining the chemical composition of the surface of a sample (2) with the aid of at least two surface analysis methods which incorporates devices (3, 7) for exciting and/or bombarding the sample and at least two analysers (12, 14) for examining the energy and/or mass of secondary particles, is equipped with a deflector (41) for deflecting the secondary particles originating from the sample in the direction of the desired analyser or analysers. <IMAGE>
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申请公布号 |
DE3104272(A1) |
申请公布日期 |
1982.08.19 |
申请号 |
DE19813104272 |
申请日期 |
1981.02.07 |
申请人 |
LEYBOLD HERAEUS GMBH |
发明人 |
KRIZEK,GEORG,DR.;PETERS,HEINRICH,DR. |
分类号 |
G01N23/225;(IPC1-7):G01N23/20;H01J49/00 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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