发明名称 X RAYS ANALYZER WITH AUTOMATIC CALIBRATION APPARATUS
摘要 PURPOSE:To achieve an easy and quick calibration of an equipment by regulating the voltage applied on an X ray tube with a calibration plate having an Al foil and a Ti foil so that the ratio of individual X ray absorprion coefficient may reach a specified value. CONSTITUTION:Circular Al and Ti foils 61 and 62 are buried into a calibration plate 6 and a notch section 63 is formed thereon. When a selector switch provided on a driver section 7 is turned to the position of 'measurement', a notch section 63 of the calibration plate 6 is provided in a path of X ray 4 and the damping level of X ray 4 from material 2 to be measured is detected with a dtector 3 whereby the content by weight of ash contained therein 2 is determined. Then, after the removal of the material 2, when the selector switch is turned to the position of 'calibration', the Al foil 61 on the calibration plate 6 and the Ti foil 62, a certain time later, are set into the path of X ray 4 to detect the current intensity of the X ray. Both detection signals are computed with an arithmetic processing circuit 5 to regulate the voltage applied on an X ray tube 1 for the ratio of the signals to reach the specified value.
申请公布号 JPS57131042(A) 申请公布日期 1982.08.13
申请号 JP19810016476 申请日期 1981.02.06
申请人 YOKOGAWA DENKI SEISAKUSHO KK 发明人 HIRANO TOKIO;INOUE MASAAKI
分类号 G01N23/06;G01N23/16;H05G1/26;(IPC1-7):01N23/06 主分类号 G01N23/06
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