发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE OF THE SAME
摘要 PURPOSE:To avoid descrepancy of metal wiring layers and cracking caused by accumulation of resin stress caused by high and low temperature difference by providing double-layer of organic films, one is hardened by ion-implantation and another is not affected by ion-implantation. CONSTITUTION:Diffused layer 2 and field insulation layer 3 are formed on surface of a semiconductor substrate 1 and apertures for contact are made. Then PSG film 6 is formed on the whole surface and photoresistor film 7 is formed by photoresistor coating. Then an aperture 5 for bonding-pad is made by the conventional photo-process. Then the surface skin layer of the photoresistor film is hardened and converted to the different substance 7'' by implanting high density ion such as P<+>, B<+>, Ar<+> or Sb<+>. The top photoresistor film 7'' has excellent mechanical strength and large protection efficiency and the bottom photoresistor 7' has pliability and protects the semiconductor from the stress.
申请公布号 JPS57128929(A) 申请公布日期 1982.08.10
申请号 JP19810015489 申请日期 1981.02.04
申请人 NIPPON DENKI KK 发明人 KIMURA KIMIYOSHI
分类号 H01L21/768;H01L21/283;H01L21/312;H01L23/522 主分类号 H01L21/768
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