发明名称 SCANNING CIRCUIT
摘要 PURPOSE:To decrease the scanning time with optional column and row information, by actuating a current detecting circuit with the row and column designation signals which are supplied from the row and column drive circuits corresponding to the row and column of a matrix circuit consisting of a resistance and a diode. CONSTITUTION:A row changeover contact ex<0> is open with a contact P0 to be scanned of a marker 0 closed, and a row designating relay RX0 of the marker O is designated. Thus a current flows through a diode DA00, resistances R00 and DD00 plus a contact rx0 of a row drive circuit RDCS and the contact ex<0>. However, a relay SX0 does not work. When the contact P0 is opened, a current flows through the contct er<0> or a relay SX0, DB00, R00, D00 plus contacts rx0 and ex0 to actuate the relay SX. Thus a contact SX0 is closed to latch FF0. In case the contact ex<0> is closed with the contact P0 opened and a column designating relay RY0 of the marker O is designated, a current flows from the contact ex<1>, a relay SY0, DC00, R00 and DE00 and through a contact ry<0> of a column drive circuit RDCRY and the contact ex<0>. Thus the contact sy0 is closed to latch the EF0.
申请公布号 JPS57127379(A) 申请公布日期 1982.08.07
申请号 JP19810012520 申请日期 1981.01.30
申请人 NIPPON DENKI KK 发明人 YOKOYAMA TATSUO
分类号 H04Q3/72;(IPC1-7):04Q3/72 主分类号 H04Q3/72
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