DEVICE FOR NON-DESTRUCTIVE CHECKING OF SEMICONDUCTOR STRUCTURES,申请号SU19802987882-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	DEVICE FOR NON-DESTRUCTIVE CHECKING OF SEMICONDUCTOR STRUCTURES
摘要
申请公布号	SU947791(A1)	申请公布日期	1982.07.30
申请号	SU19802987882	申请日期	1980.10.03
申请人	BRUSS G UNIV IM.V.I.LENINA	发明人	DROZDOV NIKOLAJ A,SU;PATRIN ALEKSEJ A,SU;PODOLNYJ EDUARD I,SU;SAVOTIN YURIJ I,SU
分类号	H01L21/66;G01R31/26;G01R31/28;(IPC1-7):G01R31/26	主分类号	H01L21/66
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Apparatus for heating liquid

Thixotropic foamable organosiloxane compositions.

MALE INCONTINENCE GUARD

WOODEN BALL PRINTING DEVICE

STRIP FORMING MACHINE

STRUCTURE FOR CULTURING FISH WITH SEAT-PLATE

3'-substituted nucleoside derivatives

Optical character recognition and item matching assisted by progressively decreasing match criteria.

Efficient multi-target tracking method.

Improved cell and circuit for monitoring photochemical reactions

Female electrical terminal.

Apparatus for use in determining foot joint position

A paste dispensing gun

Improved mass resolution in time-of-flight mass spectrometers with reflectors

Trainable transmitter having variable gain control

A new, pigment-producing, strain of bacillus thuringiensis

Separation method and apparatus