发明名称 METHOD OF AND APPARAUS FOR INSPECTING PARTICLE CLUSTER
摘要 For the detection of accumulations of particles, for instance metaphase plates, in an image converted by a raster process into electrical signals, there is first effected an electronic dilation in several directions, the parameters of the dilation being so selected that images of the chromosomes of the metaphase plates agglomerate to form unitary structures. Thereupon, an electronic erosion of images is effected in several directions, the parameters of the erosion being so selected that images of cells and impurities disappear but the agglomerated metaphase-plate images are retained. A circuit is described which consists essentially of length discriminators, decision-logic devices, delay-storage devices with provision for establishing input digital preset values, in which circuit the entire evaluation process takes place with the speed of the scanning process.
申请公布号 JPS57121756(A) 申请公布日期 1982.07.29
申请号 JP19810190467 申请日期 1981.11.27
申请人 CARL ZEISS STIFTUNG 发明人 RUUDORUFU GUROOSUKOTSUPUFU
分类号 G01N33/48;G01N15/00;G06K9/54;G06T1/00 主分类号 G01N33/48
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