| 摘要 |
This disclosure is concerned with a new technique for automatically measuring impedance (though the process is also applicable to other parameters and characteristics as well) wherein a series of voltages are sequentially presented to a common detector and analog-to-digital converter, the numerical values of which voltages are of themselves meaningless, but from which, with the aid of microprocessor calculating equipment, ratios may be calculated that indicate impedance (or other parameters).
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