发明名称 MARKING METHOD FOR RESIN-SEALED SEMICONDUCTOR DEVICE
摘要 PURPOSE:To clearly adhere the marks such as letters, patterns and the like to the surface of a semiconductor device as well as to increase the adhesive strength by a method wherein, after the resin surface of a resin-sealed semiconductor device has been voil-treated with an organic solvent, the parting agent adhered to the resin surface is removed by burning with the flame of a hydrogen gas burner, and then a marking operation is performed on the resin surface of the semiconductor device. CONSTITUTION:The wax thin film, which is a parting agent, adhered to the resin surface of a resin-sealed lead frame is removed by the boiling steam 3 of a trichlene organic agent 2, then a plating work is performed on the frame 1, cleaned and dried up, A hydrogen gas burner 5 has an output flow meter, it emits a flame from a nozzle at an output of 0.5l/cm<3>, the flame is contacted to the surface of a resin-sealed semiconductor device 8 for 0.2-1.0 seconds. After the parting agent adhered to the resin surface has been removed by burning completely, letters, patterns and the like are printed on the resin surface using a printing transfer roller 6, and the ink of the printing is hardened by an ultraviolet ray lamp irradiation device.
申请公布号 JPS63153843(A) 申请公布日期 1988.06.27
申请号 JP19860300989 申请日期 1986.12.17
申请人 MATSUSHITA ELECTRONICS CORP 发明人 HIOKI MUTSUO
分类号 H01L23/00;B29C59/08 主分类号 H01L23/00
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