发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent generation of compressive stress to be caused by noncoincidence of lattice interval of a semiconductor device by a method wherein impurities having sufficiently deep energy level to convert a silicon semiconductor layer into a semiisulating layer are implanted in the silicon semiconductor layer. CONSTITUTION:The second conductive type impurities having sufficiently deep energy level to convert a first conductive type silicon semiconductor layer 11 into a semiinsulating layer and to compensate for free carriers are implanted in the silicon semiconductor layer 11 to form the semiinsulating silicon layer 12. When the semiconductor device is to be used using liquid nitrogen as refrigerant, the energy level of impurities is made to be separated by 0.2eV or more from the conductive band to be formed according to the type conductive carriers.
申请公布号 JPS57117273(A) 申请公布日期 1982.07.21
申请号 JP19810002655 申请日期 1981.01.13
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 TSUCHIYA TOSHIAKI;ARAI EISUKE
分类号 H01L27/12;(IPC1-7):01L27/12 主分类号 H01L27/12
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