| 发明名称 |
TESTING DEVICE |
| 摘要 |
A testing apparatus, having an address generator for providing address signals to a test device and to a reference device, is provided with a programmable mask for passing only selected least significant X and Y address bits to the reference device. |
| 申请公布号 |
JPS57113500(A) |
申请公布日期 |
1982.07.14 |
| 申请号 |
JP19810154912 |
申请日期 |
1981.10.01 |
| 申请人 |
INTERN BUSINESS MACHINES CORP |
发明人 |
ROBAATO II JIYOONZU;DONARUDO EICHI UTSUDO |
| 分类号 |
G11C29/00;G01R31/28;G11C29/56 |
主分类号 |
G11C29/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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