发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To prevent a crack formed in a substrate by shaping a ground surface in the midway of a polysilicon layer grown on a groove for isolation and growing a polysilicon layer on the surface. CONSTITUTION:An N type layer 3 and a SiO2 film 6 are formed to the silicon substrate 1. The polysilicon layer 7 used as the isolation is grown through a CVD method. The layer 7 ground, and the ground surface 9 is shaped. The polysilicon layer 10 as the second layer is grown onto the surface 9. Accordingly, the crack is hardly formed in the substrate 1 because a boundary layer 8 is not generated like the layer 7 in the layer 10. |
申请公布号 |
JPS57113251(A) |
申请公布日期 |
1982.07.14 |
申请号 |
JP19800187973 |
申请日期 |
1980.12.29 |
申请人 |
FUJITSU KK |
发明人 |
SASAKI MASASHI;SANO NOBUHIRO;YANAGIHARA FUMIO |
分类号 |
H01L21/205;H01L21/304;H01L21/762 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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