发明名称 |
Testing apparatus for dielectric breakdown caused by tracking phenomena |
摘要 |
A pair of opposed electrodes is disposed on each of a plurality of electrically insulating specimens, and specified voltage is applied to each pair of electrodes. In this state, the specimens are brought to a position below a single dripping nozzle intermittently one after another to apply a drop of test solution to each specimen between the electrodes. The apparatus repeats this step cyclically.
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申请公布号 |
US4339708(A) |
申请公布日期 |
1982.07.13 |
申请号 |
US19800122660 |
申请日期 |
1980.02.19 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
SAITO, MITSURU;KARATANI, YUJI;SAKURAI, WATARU;NOBUTA, KEN'ICHI |
分类号 |
G01R31/12;G01R31/18;(IPC1-7):G01R31/18 |
主分类号 |
G01R31/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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