发明名称 Testing apparatus for dielectric breakdown caused by tracking phenomena
摘要 A pair of opposed electrodes is disposed on each of a plurality of electrically insulating specimens, and specified voltage is applied to each pair of electrodes. In this state, the specimens are brought to a position below a single dripping nozzle intermittently one after another to apply a drop of test solution to each specimen between the electrodes. The apparatus repeats this step cyclically.
申请公布号 US4339708(A) 申请公布日期 1982.07.13
申请号 US19800122660 申请日期 1980.02.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 SAITO, MITSURU;KARATANI, YUJI;SAKURAI, WATARU;NOBUTA, KEN'ICHI
分类号 G01R31/12;G01R31/18;(IPC1-7):G01R31/18 主分类号 G01R31/12
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