发明名称 DOPING METHOD FOR IMPURITY
摘要 PURPOSE:To enable doping, which ensures high impurity concentration and is at a deep level, simply without generating a thermal defect by utilizing high- speed electron rays having high energy. CONSTITUTION:An impurity sheet 3 is stacked onto a semiconductor substrate 2, and fixed to a supporting mechanism in an Al tube 1. The high-speed electron rays 6 having high energy (such as 1-10MeV) accelerated by means of an electron accelerator 5 are irradiated onto the impurity sheet 3. Accordingly, elements by electrons repelled from the impurity sheet 3 intrude into the semiconductor substrate 2, and the impurity can be doped. The doping, which ensures high impurity concentration and is at the deep level, is enabled by conducting irradiation for a long time and irradiation with high energy.
申请公布号 JPS57111018(A) 申请公布日期 1982.07.10
申请号 JP19800181203 申请日期 1980.12.23
申请人 ISE DENSHI KOGYO KK 发明人 WADA TAKAO
分类号 H01L21/22;H01L21/225;H01L21/263;H01L21/265;(IPC1-7):01L21/265 主分类号 H01L21/22
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