发明名称 |
MEMORY CELL AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To enable to form a reversely conductive type high concentration impurity region of a memory cell without discrepancy of position by a method wherein impurities contained in a dielectric film of the capacitor part are made to diffuse in a substrate by the thermal treatment after a capacitor electrode is formed. CONSTITUTION:The dielectric film 7 being mixed with impurities and a polycrystalline Si layer 1 to constitute the capacitor electrode are adhered selectively on the whole surface of the P type substrate 4 having field oxide films 5. The surface thereof is oxidized to form a gate dielectric film 8 of transfer MOSFET, and a gate electrode 2 is adhered. After patterning of the dielectric film 7 is performed, the high concentration impurities adder region 6 of the capacitor part is formed by thermal diffusion of impurities contained therein to the substrate. Accordingly the electrode region can be formed accurately in high concentration without discrepancy of positions. |
申请公布号 |
JPS57111059(A) |
申请公布日期 |
1982.07.10 |
申请号 |
JP19800186907 |
申请日期 |
1980.12.26 |
申请人 |
FUJITSU KK |
发明人 |
TAGUCHI MASAO;TOYOKURA NOBUO |
分类号 |
H01L27/10;H01L21/8242;H01L27/108;H01L29/78 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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