发明名称 MEMORY CELL AND MANUFACTURE THEREOF
摘要 PURPOSE:To enable to form a reversely conductive type high concentration impurity region of a memory cell without discrepancy of position by a method wherein impurities contained in a dielectric film of the capacitor part are made to diffuse in a substrate by the thermal treatment after a capacitor electrode is formed. CONSTITUTION:The dielectric film 7 being mixed with impurities and a polycrystalline Si layer 1 to constitute the capacitor electrode are adhered selectively on the whole surface of the P type substrate 4 having field oxide films 5. The surface thereof is oxidized to form a gate dielectric film 8 of transfer MOSFET, and a gate electrode 2 is adhered. After patterning of the dielectric film 7 is performed, the high concentration impurities adder region 6 of the capacitor part is formed by thermal diffusion of impurities contained therein to the substrate. Accordingly the electrode region can be formed accurately in high concentration without discrepancy of positions.
申请公布号 JPS57111059(A) 申请公布日期 1982.07.10
申请号 JP19800186907 申请日期 1980.12.26
申请人 FUJITSU KK 发明人 TAGUCHI MASAO;TOYOKURA NOBUO
分类号 H01L27/10;H01L21/8242;H01L27/108;H01L29/78 主分类号 H01L27/10
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