发明名称 EXTERNAL APPEARANCE TEST OF SEMICONDUCTOR PELLET
摘要 PURPOSE:To simplify the check of positions and to remove pelllets precisely when defects pelleto are pushed off with a needle from semiconductor pellets attached to a sheet by spot lighting the places of defect pellets. CONSTITUTION:Plural semiconductor pellets arranged in line and attached to the back of a transparent or semitransparent sheet 2 are held on a top part of an inner cylinder 7 by putting the sheet 2 between the inner cylinder 7 and outter cylinder 6. A spot light source 10 set up so as to be united with a needle 9 to push off defect pellets from the sheet irradiates near the top of the needle 9. When the needle 9 is brought close to the sheet 2 and the spot light source 10 lightens pellets, the lighting image of a lighting spot is observed through mirrors 4, 5 and the position of the needle 9 is confirmed on the instant. Thus, if the lighting image is observed on the surface image of a defect pellet before the needle 9 pushes off the defect pellet, the defect pellet can be removed precisely.
申请公布号 JPS57106848(A) 申请公布日期 1982.07.02
申请号 JP19800183234 申请日期 1980.12.23
申请人 SHIN NIPPON DENKI KK 发明人 YAMAGUCHI HIROYUKI
分类号 G01N21/88;G01N21/956 主分类号 G01N21/88
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