发明名称 DEFECT INSPECTION SYSTEM
摘要 <p>A defect inspection system which inspects the defects on an object to be inspected by photosensing the inspected object with a monochrome television camera. A pair of detection circuits are provided which receive such image signal corresponding to the inspected object from the television camera and have different sensitivities so that both or only one of the pair outputs a signal in accordance with the rate of change of the image signal level with respect to time. Both of the outputs from the pair of detection circuits are supplied to a mixer circuit. In this case, the mixer circuit is so formed that it will only output a defect detection signal when only one of the above mentioned pair of detection circuits shall output a signal.</p>
申请公布号 CA1126855(A) 申请公布日期 1982.06.29
申请号 CA19800345970 申请日期 1980.02.19
申请人 HAJIME INDUSTRIES LTD. 发明人 YOSHIDA, HAJIME
分类号 G01B11/24;G01N21/88;G01N21/94;G06T1/00;(IPC1-7):04N7/18 主分类号 G01B11/24
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