| 摘要 |
An infrared film thickness measuring device has an infrared light projector (10) equipped with a rotating disc (14) on which band pass filters (18, 20) for a reference wavelength and a measurement wavelength are arranged, so that infrared light passing through the disc (14) have only the one or the other wavelength. A concave reflector (36) between the projector (10) and the film (26) has a concave hemispherical reflecting surface (36). In the centre of this reflector, a second reflector (44) having a convex reflector surface (42) is arranged. Infrared light passing through the film (26) is deflected by a light collector guide (48), having a conical reflecting surface (46), onto an infrared detector (30). Interferences causing errors in measurement are avoided, since the infrared rays penetrating the film are diffused. <IMAGE>
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