发明名称 |
Method and system for measuring the diameter of an electron beam |
摘要 |
A method of measuring the diameter of an electron beam in which the electron beam diameter is measured from the leading edge or trailing edge of a detector signal that is obtained as the mark area formed on the specimen is scanned by the electron beam. This method comprises the following steps: scanning the specimen by the electron beam at least once to find the maximum and minimum values of the detector signal; setting two threshold levels based on the maximum and minimum values; scanning the mark area by the electron beam to measure the time interval during which the level of the detector signal is within the two threshold levels; and calculating the beam diameter.
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申请公布号 |
US4336597(A) |
申请公布日期 |
1982.06.22 |
申请号 |
US19800163295 |
申请日期 |
1980.06.26 |
申请人 |
NIPPON TELEGRAPH AND TELEPHONE PUBLIC CORP. |
发明人 |
OKUBO, TSUNEO;KATO, YASUO;MATSUOKA, GENYA |
分类号 |
H01J37/04;H01J37/26;H01J37/304;H01L21/027;H01L21/30;(IPC1-7):G01N23/00 |
主分类号 |
H01J37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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